Peak assignment
The target reflection is checked against the phase model and neighbouring contributions before width values are extracted.
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Anonymized completed workXRD peak width and crystallite-size interpretation
A selected reflection was reviewed in the context of the complete diffraction pattern so that FWHM, overlap and broadening-related conclusions could be reported consistently.
Analysis workflow
Profile evaluation
FWHM, peak position and profile shape are obtained from a stated fitting route rather than measured from a screenshot.
Size interpretation
Scherrer-type results are reported as coherent-domain estimates and separated from physical particle size.
Instrumental broadening matters
Observed peak width contains sample and instrumental contributions. A calibrated standard pattern measured under comparable optics is needed when instrumental broadening must be separated quantitatively.
Without an instrumental standard, comparative trends may still be useful for consistently measured samples, but absolute crystallite-size claims require appropriate qualification.
Need peak-width results that can be defended?
Provide the original numeric pattern, scan conditions and any instrumental-standard data available.
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